Equipment

Brillouin Light Scattering

Brillouin Light Scattering

Optical system for characterizing spin-wave frequencies in ultrathin magnetic structures.

Specifications

  • JRS Scientific Instruments Tandem Fabry-Perot Interferrometer (frequency range 0 - 300 GHz)
  • Forward- and backward-scattering configuration
  • Nd:Vanadate laser operating at 532 nm
  • Hitatchi photomultiplier with dark current less than 2 counts per second
  • Two electromagnets with a magnetic field up to 8 kG
  • Integrated Picoprobe station for the study of magnetic excitations in microstrip lines
Ferromagnetic Resonance

Ferromagnetic Resonance

Measures microwave absorption in order to characterize various magnetic properties.

 
Giant Magneto-Resistance

Giant Magneto-Resistance

Measures electrical resistance as a function of applied field in exchange-coupled magnetic films.

 
Microwave Measurements System

Microwave Measurements System

System for the microwave characterization of on-wafer devices up to 110 GHz.

Specifications

  • Performance Network Analyzer (PNA) E8361A (0-67 GHz)
  • Millimeter Head Controler (N5260A) + Waveguide T/R module with a bias-T (up to 110GHz)
  • Pico-probe excitation and detection
Magneto Optic Kerr effect

Magneto-Optic Kerr Effect

Optical system for measuring hysteresis curves in ultrathin magnetic structures.

Specifications

  • Magnetic Field Range: ± 2.5 kOe
  • Diode laser at 670 nm and 4 mW power
  • High-quality polarizers
  • Temperature Range: 20 K - 400 K
Molecular Beam Epitaxy

Molecular Beam Epitaxy

Ultra-high vacuum chamber for deposition and in-situ characterization of ultrathin magnetic films.

Molecular Beam Epitaxy

  • Growth Chamber
    • 8 thermal evaporation sources and linear 4 pocket e-gun
    • Reflection High Energy Electron Diffraction
    • Residual Gas Analyzer unit
    • Thickness monitor
  • Analysis Chamber
    • Low Energy Electron Diffraction units
    • Auger Electron Spectroscopy and Ion Sputtering units
  • k-Space Associate CCD Camera system (KSA400) for data acquisition of diffraction images
  • Base pressure of 10-10 TorrSophisticated sample manipulator with five degrees of freedom operating at 150-1000 K