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Sputter Deposition Techniques
Ohring: Chapter 3, section 7
simplest - basically what we have talked about so far
Parameters:
- Argon Pressure
- optimum deposition rate around 100 mTorr
- compromise between
- increasing number of Ar ions
- increasing scattering of Ar ions with neutral Ar atoms
- if you can increase the number of ions without increasing the number of neutrals, you can operate at lower pressures
- Sputter voltage
- maximize sputter yield (S)
- typically -2 to -5 kV
- Substrate Bias Voltage
- substrate is being bombarded by electrons and ions from target and plasma
- sputtering film while you deposit
- neutral atoms deposit independently
- put negative bias on the substrate to control this
- can significantly change film properties
- Substrate temperature
- control with substrate heater
- heating from deposited material
- increases with increasing sputter voltage
- decreases with increasing substrate bias
- Deposition rate
- changes with Ar pressure
- increases with sputter yield
- usually increases with high voltage
- Particle Energy
- increases with increasing sputter voltage
- decreases with increasing substrate bias
- decreases with increasing Ar pressure
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Good for insulating materials
in DC systems, positive charge builds up on the cathode (target)need 1012 volts to sputter insulators !!avoid charge build up by alternating potential
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target
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substrate + chamber
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sputter deposition occurs when target is negative
substrate and chamber make a very large electrode - so not much sputtering of substrate
Physical process
- frequencies less than about 50 kHz
- electrons and ions in plasma are mobile
- both follow the switching of the anode and cathode
- basically DC sputtering of both surfaces
- frequencies above about 50 kHz
- ions (heavy) can no longer follow the switching
- electrons can neutralize positive charge build up
Advantages:
Easier to keep plasma going under these conditionsCan operate at lower Ar pressures (1-15 mTorr)
fewer gas collisions => more line of sight deposition
- use with DC or RF
- goal: increase ionization of Ar
- Why? Higher sputter rates at lower Ar pressures (down to 0.5 mTorr)
- fewer gas collisions - more line of sight
- How ? increase probability of electrons striking Ar
- increase electron path length
- use electric and magnetic fields
Most common configuration: crossed electric and magnetic fields
Put magnets (200 Gauss) behind target:
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- traps electrons near cathode
- more ionization near cathods (10x)
- fewer electrons reach substrate (less heating)
- with evaporation or sputtering (or chemical vapor deposition)
- bombard surface with ions
- not necessarily same type as in film
- ions typically NOT incorporated in film
- relatively low voltages (50 - 300 eV)
- leads to
- physical rearrangement
- local heating
- can change film properties
- for better or worse
- disruption of columnar growth requires about 20 eV of added energy per depositing atom
- add reactive gas to chamber during deposition (evaporation or sputtering)
- oxygen, nitrogen
- chemical reaction takes place on substrate and target
- can poison target if chemical reactions are faster than sputter rate
- adjust reactive gas flow to get good stoichiometry without incorporating excess gas into film
EVAPORATION SPUTTERING low energy atoms
higher energy atoms
high vacuum path
- few collisions
- line of sight deposition
- little gas in film
low vacuum, plasma path
- many collisions
- less line of sight deposition
- gas in film
larger grain size
smaller grain size
fewer grain orientations
many grain orientations
poorer adhesion
better adhesion